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Characterisation and control of defects in semiconductors

Bibliografiske detaljer
Andre forfattere: Tuomisto, Filip (Editor)
Format: Electronic Resource
Sprog:engelsk
Udgivet: London, United Kingdom The Institution of Engineering and Technology [2019]
Fag:
Ion implantation.
Magnetic resonance.
Semiconductor doping.
Semiconductors > Materials.
Silicon.
Electronic books.
Online adgang:Available for University of the Philippines Diliman via IET Digital Library. Click here to access
Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
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