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Characterisation and control of defects in semiconductors
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Characterisation and control of defects in semiconductors

Dettagli Bibliografici
Altri autori: Tuomisto, Filip (Redattore)
Natura: Electronic Resource
Lingua:English
Pubblicazione: London, United Kingdom The Institution of Engineering and Technology [2019]
Soggetti:
Ion implantation.
Magnetic resonance.
Semiconductor doping.
Semiconductors > Materials.
Silicon.
Electronic books.
Accesso online:Available for University of the Philippines Diliman via IET Digital Library. Click here to access
Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
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