Computed electron micrographs and defect identification

书目详细资料
其他作者:	Head, A. K. (Editor), Humble, P. (Editor), Clarebrough, L. M. (Editor), Morton, A. J. (Editor), Forwood, C. T. (Editor)
格式:	Electronic Resource
语言:	English
出版:	Amsterdam North-Holland [1973]
丛编:	Defects in crystalline solids v. 7
主题:	Metals > Defects > Data processing. Electron microscopy > Data processing. Electronic books.
在线阅读:	Available for University of the Philippines System via ScienceDirect. Click here to access Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy