Computed electron micrographs and defect identification

Bibliographic Details
Other Authors:	Head, A. K. (Editor), Humble, P. (Editor), Clarebrough, L. M. (Editor), Morton, A. J. (Editor), Forwood, C. T. (Editor)
Format:	Electronic Resource
Language:	English
Published:	Amsterdam North-Holland [1973]
Series:	Defects in crystalline solids v. 7
Subjects:	Metals > Defects > Data processing. Electron microscopy > Data processing. Electronic books.
Online Access:	Available for University of the Philippines System via ScienceDirect. Click here to access Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy