Computed electron micrographs and defect identification

Detaylı Bibliyografya
Diğer Yazarlar:	Head, A. K. (Editör), Humble, P. (Editör), Clarebrough, L. M. (Editör), Morton, A. J. (Editör), Forwood, C. T. (Editör)
Materyal Türü:	Electronic Resource
Dil:	English
Baskı/Yayın Bilgisi:	Amsterdam North-Holland [1973]
Seri Bilgileri:	Defects in crystalline solids v. 7
Konular:	Metals > Defects > Data processing. Electron microscopy > Data processing. Electronic books.
Online Erişim:	Available for University of the Philippines System via ScienceDirect. Click here to access Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy