Computed electron micrographs and defect identification

Xehetasun bibliografikoak
Beste egile batzuk:	Head, A. K. (Argitaratzailea), Humble, P. (Argitaratzailea), Clarebrough, L. M. (Argitaratzailea), Morton, A. J. (Argitaratzailea), Forwood, C. T. (Argitaratzailea)
Formatua:	Electronic Resource
Hizkuntza:	English
Argitaratua:	Amsterdam North-Holland [1973]
Saila:	Defects in crystalline solids v. 7
Gaiak:	Metals > Defects > Data processing. Electron microscopy > Data processing. Electronic books.
Sarrera elektronikoa:	Available for University of the Philippines System via ScienceDirect. Click here to access Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy