Computed electron micrographs and defect identification

ग्रंथसूची विवरण
अन्य लेखक:	Head, A. K. (संपादक), Humble, P. (संपादक), Clarebrough, L. M. (संपादक), Morton, A. J. (संपादक), Forwood, C. T. (संपादक)
स्वरूप:	Electronic Resource
भाषा:	English
प्रकाशित:	Amsterdam North-Holland [1973]
श्रृंखला:	Defects in crystalline solids v. 7
विषय:	Metals > Defects > Data processing. Electron microscopy > Data processing. Electronic books.
ऑनलाइन पहुंच:	Available for University of the Philippines System via ScienceDirect. Click here to access Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy