Computed electron micrographs and defect identification

গ্রন্থ-পঞ্জীর বিবরন
অন্যান্য লেখক:	Head, A. K. (Editor), Humble, P. (Editor), Clarebrough, L. M. (Editor), Morton, A. J. (Editor), Forwood, C. T. (Editor)
বিন্যাস:	Electronic Resource
ভাষা:	English
প্রকাশিত:	Amsterdam North-Holland [1973]
মালা:	Defects in crystalline solids v. 7
বিষয়গুলি:	Metals > Defects > Data processing. Electron microscopy > Data processing. Electronic books.
অনলাইন ব্যবহার করুন:	Available for University of the Philippines System via ScienceDirect. Click here to access Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy