Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS

Sonraí bibleagrafaíochta
Príomhchruthaitheoirí:	Posser, Gracieli (Údar), Sapatnekar, Sachin S. 1967- (Údar), Reis, Ricardo (Údar)
Údar corparáideach:	SpringerLink (Online service)
Formáid:	Electronic Resource
Teanga:	English
Foilsithe / Cruthaithe:	Cham Springer [2017]
Ábhair:	Logic circuits. Electrodiffusion. Electronic books.
Rochtain ar líne:	Available for University of the Philippines System via SpringerLink. Click here to access Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy