Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS
| Hlavní autoři: | , , |
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| Korporativní autor: | |
| Médium: | Electronic Resource |
| Jazyk: | English |
| Vydáno: |
Cham
Springer
[2017]
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| Témata: | |
| On-line přístup: | Available for University of the Philippines System via SpringerLink. Click here to access Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy |