Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS
| मुख्य लेखकों: | , , |
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| निगमित लेखक: | |
| स्वरूप: | Electronic Resource |
| भाषा: | English |
| प्रकाशित: |
Cham
Springer
[2017]
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| विषय: | |
| ऑनलाइन पहुंच: | Available for University of the Philippines System via SpringerLink. Click here to access Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy |