Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS

Dettagli Bibliografici
Autori principali:	Posser, Gracieli (Autore), Sapatnekar, Sachin S. 1967- (Autore), Reis, Ricardo (Autore)
Ente Autore:	SpringerLink (Online service)
Natura:	Electronic Resource
Lingua:	English
Pubblicazione:	Cham Springer [2017]
Soggetti:	Logic circuits. Electrodiffusion. Electronic books.
Accesso online:	Available for University of the Philippines System via SpringerLink. Click here to access Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy