Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS

Detalles Bibliográficos
Autores principales:	Posser, Gracieli (Autor), Sapatnekar, Sachin S. 1967- (Autor), Reis, Ricardo (Autor)
Autor Corporativo:	SpringerLink (Online service)
Formato:	Electronic Resource
Lenguaje:	English
Publicado:	Cham Springer [2017]
Materias:	Logic circuits. Electrodiffusion. Electronic books.
Acceso en línea:	Available for University of the Philippines System via SpringerLink. Click here to access Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy