Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS

Xehetasun bibliografikoak
Egile Nagusiak:	Posser, Gracieli (Egilea), Sapatnekar, Sachin S. 1967- (Egilea), Reis, Ricardo (Egilea)
Erakunde egilea:	SpringerLink (Online service)
Formatua:	Electronic Resource
Hizkuntza:	ingelesa
Argitaratua:	Cham Springer [2017]
Gaiak:	Logic circuits. Electrodiffusion. Electronic books.
Sarrera elektronikoa:	Available for University of the Philippines System via SpringerLink. Click here to access Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy