Electromigration inside logic cells modeling, analyzing and mitigating signal electromigration in NanoCMOS

Detalles Bibliográficos
Main Authors:	Posser, Gracieli (Author), Sapatnekar, Sachin S. 1967- (Author), Reis, Ricardo (Author)
Autor Corporativo:	SpringerLink (Online service)
Formato:	Electronic Resource
Idioma:	English
Publicado:	Cham Springer [2017]
Subjects:	Logic circuits. Electrodiffusion. Electronic books.
Acceso en liña:	Available for University of the Philippines System via SpringerLink. Click here to access Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy