Scanning electron microscopy and x-ray microanalysis
| Päätekijä: | |
|---|---|
| Aineistotyyppi: | Electronic Resource |
| Kieli: | englanti |
| Julkaistu: |
New York
Springer
[2003]
|
| Painos: | Third edition. |
| Aiheet: | |
| Linkit: | Available for University of the Philippines Diliman College of Engineering via SpringerLink. Click here to access Also available remotely for University of the Philippines Diliman College of Engineering via SpringerLink. Click here to access thru EZproxy |