X-Ray diffraction analysis of MBE-grown InxGa1-xAs/GaAs superlattices on GaAs (100) substrates

Bibliografske podrobnosti
Glavni avtor: Fernando, Joel G. (Author)
Drugi avtorji: Somintac, Armando S. (thesis adviser.)
Format: Thesis
Jezik:angleščina
Izdano: Quezon City National Institute of Physics, College of Science, University of the Philippines Diliman 2009
Teme: