कवर छवि

X-ray diffractometry and raman spectroscopy investigation of silicon nanowires fabricated via electroless etching

ग्रंथसूची विवरण
मुख्य लेखक: Cabello, Neil Irvin F.
स्वरूप: थीसिस
भाषा:अंग्रेज़ी
प्रकाशित: 2012.
विषय:
Raman spectroscopy.
X-ray diffractometer.
Silicon > Electric properties.