X-ray diffractometry and raman spectroscopy investigation of silicon nanowires fabricated via electroless etching

X-ray diffractometry and raman spectroscopy investigation of silicon nanowires fabricated via electroless etching

Bibliografiska uppgifter
Huvudupphovsman: Cabello, Neil Irvin F.
Materialtyp: Lärdomsprov
Språk:English
Publicerad: 2012.
Ämnen:
Raman spectroscopy.
X-ray diffractometer.
Silicon > Electric properties.