Failure-free integrated circuit packages systematic elimination of failures through reliability engineering, failure analysis, and material improvements

Failure-free integrated circuit packages systematic elimination of failures through reliability engineering, failure analysis, and material improvements

書誌詳細
その他の著者: Cohn, Charles, Harper, Charles A.
フォーマット: 図書
言語:English
出版事項: New York McGraw-Hill c2005.
主題:
Microelectronic packaging.
Integrated circuits > Fault tolerance.