Weighted pseudorandom hybrid BIST.

This paper presents a new test data-compression scheme that is a hybrid approach between external testing and built-in self-test (BIST). The proposed approach is based on weighted pseudorandom testing and uses a novel approach for compressing and storing the weight sets. Three levels of compression...

Полное описание

Библиографические подробности

Опубликовано в::	IEEE Transactions on VLSI systems 12, 12 (2004).
Главный автор:	Jas, A.
Формат:	Статья
Язык:	English
Предметы:	Built in self test. External testing. Fault coverage. Function logic. Hybrid BIST architecture. Hybrid method. Test cost reduction. Test data compression. Tester bandwidth requirements. Tester storage requirements. Weight set compression. Weight set storage. Weighted pseudorandom testing.