Weighted pseudorandom hybrid BIST.
This paper presents a new test data-compression scheme that is a hybrid approach between external testing and built-in self-test (BIST). The proposed approach is based on weighted pseudorandom testing and uses a novel approach for compressing and storing the weight sets. Three levels of compression...
| প্রকাশিত: | IEEE Transactions on VLSI systems 12, 12 (2004). |
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| প্রধান লেখক: | |
| বিন্যাস: | প্রবন্ধ |
| ভাষা: | English |
| বিষয়গুলি: |