Weighted pseudorandom hybrid BIST.

Weighted pseudorandom hybrid BIST.

This paper presents a new test data-compression scheme that is a hybrid approach between external testing and built-in self-test (BIST). The proposed approach is based on weighted pseudorandom testing and uses a novel approach for compressing and storing the weight sets. Three levels of compression...

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Bibliographic Details
Published in:IEEE Transactions on VLSI systems 12, 12 (2004).
Main Author: Jas, A.
Format: Article
Language:English
Subjects:
Built in self test.
External testing.
Fault coverage.
Function logic.
Hybrid BIST architecture.
Hybrid method.
Test cost reduction.
Test data compression.
Tester bandwidth requirements.
Tester storage requirements.
Weight set compression.
Weight set storage.
Weighted pseudorandom testing.