Weighted pseudorandom hybrid BIST.

This paper presents a new test data-compression scheme that is a hybrid approach between external testing and built-in self-test (BIST). The proposed approach is based on weighted pseudorandom testing and uses a novel approach for compressing and storing the weight sets. Three levels of compression...

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Τόπος έκδοσης:	IEEE Transactions on VLSI systems 12, 12 (2004).
Κύριος συγγραφέας:	Jas, A.
Μορφή:	Άρθρο
Γλώσσα:	English
Θέματα:	Built in self test. External testing. Fault coverage. Function logic. Hybrid BIST architecture. Hybrid method. Test cost reduction. Test data compression. Tester bandwidth requirements. Tester storage requirements. Weight set compression. Weight set storage. Weighted pseudorandom testing.