Estimation of FMAX and ISB in microprocessors.
Inherent process device variations and fluctuations during manufacturing have a large impact on the microprocessor maximum clock frequency and total leakage power. These fluctuations have a statistical distribution that calls for usage of statistical methods for frequency and leakage analysis. This...
| הוצא לאור ב: | IEEE Transactions on VLSI systems 13, 10 (2005). |
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| מחבר ראשי: | |
| פורמט: | Article |
| שפה: | English |
| נושאים: |