Estimation of FMAX and ISB in microprocessors.

Inherent process device variations and fluctuations during manufacturing have a large impact on the microprocessor maximum clock frequency and total leakage power. These fluctuations have a statistical distribution that calls for usage of statistical methods for frequency and leakage analysis. This...

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הוצא לאור ב:IEEE Transactions on VLSI systems 13, 10 (2005).
מחבר ראשי: Abulafia, Y.
פורמט: Article
שפה:English
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