Estimation of FMAX and ISB in microprocessors.

Inherent process device variations and fluctuations during manufacturing have a large impact on the microprocessor maximum clock frequency and total leakage power. These fluctuations have a statistical distribution that calls for usage of statistical methods for frequency and leakage analysis. This...

Full description

Bibliographic Details
Published in:IEEE Transactions on VLSI systems 13, 10 (2005).
Main Author: Abulafia, Y.
Format: Article
Language:English
Subjects: