Estimation of FMAX and ISB in microprocessors.

Inherent process device variations and fluctuations during manufacturing have a large impact on the microprocessor maximum clock frequency and total leakage power. These fluctuations have a statistical distribution that calls for usage of statistical methods for frequency and leakage analysis. This...

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Опубликовано в::	IEEE Transactions on VLSI systems 13, 10 (2005).
Главный автор:	Abulafia, Y.
Формат:	Статья
Язык:	английский
Предметы:	FMAX estimation. ISB estimation. Critical path analysis. Failure probability. Frequency analysis. Full chip parameters. High-level parameters. Leakage analysis. Maximum clock frequency. Maximum frequency distribution. Microprocessors. Total leakage power.