Microarchitecture-level leakage reduction with data retention.
In this paper, we study microarchitecture-level leakage energy reduction by power gating. We consider the virtual power/ground rails clamp (VRC) and multithreshold CMOS (MTCMOS) techniques and apply VRC to memory-based units for data retention and MTCMOS to the other units. We propose a systematic m...
الحاوية / القاعدة: | IEEE Transactions on VLSI systems 13, 11 (2005). |
---|---|
المؤلف الرئيسي: | |
التنسيق: | مقال |
اللغة: | English |
الموضوعات: |