Microarchitecture-level leakage reduction with data retention.
In this paper, we study microarchitecture-level leakage energy reduction by power gating. We consider the virtual power/ground rails clamp (VRC) and multithreshold CMOS (MTCMOS) techniques and apply VRC to memory-based units for data retention and MTCMOS to the other units. We propose a systematic m...
| Izdano u: | IEEE Transactions on VLSI systems 13, 11 (2005). |
|---|---|
| Glavni autor: | |
| Format: | Članak |
| Jezik: | engleski |
| Teme: |