Characterization in silicon processing

Characterization in silicon processing

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Xehetasun bibliografikoak
Beste egile batzuk: Strausser, Yale, Brundle, C. Richard, Evans, Charles A.
Formatua: Liburua
Hizkuntza:English
Argitaratua: New York Momentum Press c2010.
Gaiak:
Silicon.
Electric conductors.
Semiconductor films.
Surface chemistry.