Testing of core-based systems-on-a-chip.

Available techniques for testing of core-based systems-on-a-chip (SOCs) do not provide a systematic means for synthesizing low-overhead test architectures and compact test solutions. In this paper, we provide a comprehensive framework that generates low-overhead compact test solutions for SOCs. Firs...

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Xuất bản năm:	IEEE Transactions on computer-aided design of integrated circuits and systems 20, 3 (2001).
Tác giả chính:	Ravi, S.
Định dạng:	Bài viết
Ngôn ngữ:	Tiếng Anh
Những chủ đề:	Core access. Core-based systems-on-a-chip. Finite-state automata. Hardware additions. Hardware behavior. Low-overhead test architectures. Register-transfer level circuit. Satisfiability-based solution. Symbolic test. System-level average area overhead. Test application time reduction. Testability analysis. Transparency modes.