Testing of core-based systems-on-a-chip.
Available techniques for testing of core-based systems-on-a-chip (SOCs) do not provide a systematic means for synthesizing low-overhead test architectures and compact test solutions. In this paper, we provide a comprehensive framework that generates low-overhead compact test solutions for SOCs. Firs...
| Published in: | IEEE Transactions on computer-aided design of integrated circuits and systems 20, 3 (2001). |
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| Main Author: | |
| Format: | Article |
| Language: | English |
| Subjects: |