On the nonenumerative path delay fault simulation problem.

The problem of determining the exact number of path delay faults that a given test set detects in a combinational circuit is shown to be intractable. This result further strengthens the importance of several recently proposed pessimistic heuristics as well as exact exponential algorithms for this no...

Szczegółowa specyfikacja

Opis bibliograficzny

Wydane w:	IEEE Transactions on computer-aided design of integrated circuits and systems 21, 9 (2002).
1. autor:	Kagaris, D.
Format:	Artykuł
Język:	English
Hasła przedmiotowe:	NP-hardness. Automatic test pattern generation. Combinational circuit. Exact exponential algorithms. Fault simulation. Nonenumerative problem. Path delay faults. Pessimistic heuristics. Polynomial time pessimistic algorithm.