On the nonenumerative path delay fault simulation problem.

The problem of determining the exact number of path delay faults that a given test set detects in a combinational circuit is shown to be intractable. This result further strengthens the importance of several recently proposed pessimistic heuristics as well as exact exponential algorithms for this no...

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Bibliographic Details

Published in:	IEEE Transactions on computer-aided design of integrated circuits and systems 21, 9 (2002).
Main Author:	Kagaris, D.
Format:	Article
Language:	English
Subjects:	NP-hardness. Automatic test pattern generation. Combinational circuit. Exact exponential algorithms. Fault simulation. Nonenumerative problem. Path delay faults. Pessimistic heuristics. Polynomial time pessimistic algorithm.