On the nonenumerative path delay fault simulation problem.
The problem of determining the exact number of path delay faults that a given test set detects in a combinational circuit is shown to be intractable. This result further strengthens the importance of several recently proposed pessimistic heuristics as well as exact exponential algorithms for this no...
| 发表在: | IEEE Transactions on computer-aided design of integrated circuits and systems 21, 9 (2002). |
|---|---|
| 主要作者: | |
| 格式: | 文件 |
| 语言: | 英语 |
| 主题: |