On the nonenumerative path delay fault simulation problem.
The problem of determining the exact number of path delay faults that a given test set detects in a combinational circuit is shown to be intractable. This result further strengthens the importance of several recently proposed pessimistic heuristics as well as exact exponential algorithms for this no...
| Τόπος έκδοσης: | IEEE Transactions on computer-aided design of integrated circuits and systems 21, 9 (2002). |
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| Κύριος συγγραφέας: | |
| Μορφή: | Άρθρο |
| Γλώσσα: | English |
| Θέματα: |