Room-temperature testing for high critical-current-density Josephson junctions.

This paper demonstrates that room-temperature resistance measurements can accurately predict the critical current and normal resistance of high critical-current-density junctions. We fabricated high critical-current-density (~200 μA/μm2=20 kA/cm2) Nb/Al/AlOx/Nb Josephson junctions in cross-bridge Ke...

Täydet tiedot

Bibliografiset tiedot

Julkaisussa:	IEEE Transactions on applied superconductivity 10, 4 (2000).
Päätekijä:	O'Hara, M.J
Aineistotyyppi:	Artikkeli
Kieli:	englanti
Aiheet:	300 K. 4.2 K. Nb-Al-AlO-Nb. Nb/Al/AlOx/Nb Josephson junction. Critical current. Critical current density. Cross-bridge Kelvin resistor test structure. Current crowding. Electrical properties. Normal resistance. Room temperature resistance measurement. Two-dimensional mathematical model.