Room-temperature testing for high critical-current-density Josephson junctions.

This paper demonstrates that room-temperature resistance measurements can accurately predict the critical current and normal resistance of high critical-current-density junctions. We fabricated high critical-current-density (~200 μA/μm2=20 kA/cm2) Nb/Al/AlOx/Nb Josephson junctions in cross-bridge Ke...

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Bibliographic Details

Published in:	IEEE Transactions on applied superconductivity 10, 4 (2000).
Main Author:	O'Hara, M.J
Format:	Article
Language:	English
Subjects:	300 K. 4.2 K. Nb-Al-AlO-Nb. Nb/Al/AlOx/Nb Josephson junction. Critical current. Critical current density. Cross-bridge Kelvin resistor test structure. Current crowding. Electrical properties. Normal resistance. Room temperature resistance measurement. Two-dimensional mathematical model.