Minimization of the mechanical-stress-induced inaccuracy in bandgap voltage references.

This paper shows a systematic approach to calculate and to minimize mechanical-stress-related problems in bandgap voltage references. Mechanical stress is the main cause of long-term drift and packaging-induced inaccuracy in bandgap voltage references. Especially, low-cost epoxy packaging can cause...

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Bibliographic Details

Published in:	IEEE Journal of solid state circuits 38, 7 (2003).
Main Author:	Fruett, F.
Format:	Article
Language:	English
Subjects:	IC technology. Bandgap voltage reference. Bipolar transistor. Epoxy packaging. Long-term drift. Mechanical stress. Piezojunction effect. Thermal cycling.