Recombination lifetime measurements in silicon

Recombination lifetime measurements in silicon

Détails bibliographiques
Autres auteurs: Gupta, D. C. (Dinesh C.), Bacher, Fred R. 1955-, Hughes, William M. 1948-
Format: Livre
Langue:English
Publié: West Conshohocken, PA ASTM c1998.
Sujets:
Semiconductors > Testing > Congresses.
Service life (Engineering) > Forecasting > Congresses.
Electronic measurements > Congresses.