Recombination lifetime measurements in silicon

Recombination lifetime measurements in silicon

Bibliographic Details
Other Authors: Gupta, D. C., Bacher, Fred R. 1955-, Hughes, William M. 1948-
Resource Type: Book
Language:English
Published: West Conshohocken, PA ASTM c1998.
Subjects:
Semiconductors > Testing > Congresses.
Service life (Engineering) > Forecasting > Congresses.
Electronic measurements > Congresses.

College of Science (UP Diliman)

Accession # Call # Volume/Part# Copy # Collection Circulation Type Circulation Status
CS/T-2008-G-03 TK 7871.852 R43 1998 Regular Circulation On-Shelf