Recombination lifetime measurements in silicon

Recombination lifetime measurements in silicon

Opis bibliograficzny
Kolejni autorzy: Gupta, D. C. (Dinesh C.), Bacher, Fred R. 1955-, Hughes, William M. 1948-
Format: Książka
Język:English
Wydane: West Conshohocken, PA ASTM c1998.
Hasła przedmiotowe:
Semiconductors > Testing > Congresses.
Service life (Engineering) > Forecasting > Congresses.
Electronic measurements > Congresses.