Recombination lifetime measurements in silicon.

Recombination lifetime measurements in silicon.

Bibliografiset tiedot
Aineistotyyppi: Kirja
Kieli:English
Julkaistu: West Conshohocken, PA ASTM 1998.
Aiheet:
Semiconductors > Testing > Congresses.
Sevice life (Engineering) > Forecasting > Congresses.
Electronic measurements > Congresses.