Recombination lifetime measurements in silicon.

Recombination lifetime measurements in silicon.

Dades bibliogràfiques
Format: Llibre
Idioma:English
Publicat: West Conshohocken, PA ASTM 1998.
Matèries:
Semiconductors > Testing > Congresses.
Sevice life (Engineering) > Forecasting > Congresses.
Electronic measurements > Congresses.