Diagnostic measurements in LSI/VLSI integrated circuits production

Detalles Bibliográficos
Autor principal:	Jakubowski, Andrzej
Otros Autores:	Marciniak, Wieslaw, Przewlocki, Henryk M.
Formato:	Libro
Lenguaje:	inglés
Publicado:	Singapore World Scientific 1991.
Materias:	Integrated circuits > Very large scale integration > Design and construction. Integrated circuits > Very large scale integration > Testing.