Diagnostic measurements in LSI/VLSI integrated circuits production

Diagnostic measurements in LSI/VLSI integrated circuits production

Dades bibliogràfiques
Autor principal: Jakubowski, Andrzej
Altres autors: Marciniak, Wieslaw, Przewlocki, Henryk M.
Format: Llibre
Idioma:English
Publicat: Singapore World Scientific 1991.
Matèries:
Integrated circuits > Very large scale integration > Design and construction.
Integrated circuits > Very large scale integration > Testing.