Diagnostic measurements in LSI/VLSI integrated circuits production

Diagnostic measurements in LSI/VLSI integrated circuits production

Bibliografische gegevens
Hoofdauteur: Jakubowski, Andrzej
Andere auteurs: Marciniak, Wieslaw, Przewlocki, Henryk M.
Formaat: Boek
Taal:English
Gepubliceerd in: Singapore World Scientific 1991.
Onderwerpen:
Integrated circuits > Very large scale integration > Design and construction.
Integrated circuits > Very large scale integration > Testing.