Bridging faults and IDDQ testing

Bridging faults and IDDQ testing

Bibliografiska uppgifter
Institutionell upphovsman: IEEE Computer Society. Test Technology Technical Committee
Materialtyp: Bok
Språk:English
Publicerad: Los Alamitos, Calif. IEEE Computer Society Press c1992.
Ämnen:
IDDQ testing.
Metal oxide semiconductors, Complementary > Testing > Data processing.