Bridging faults and IDDQ testing

Bridging faults and IDDQ testing

Detaylı Bibliyografya
Müşterek Yazar: IEEE Computer Society. Test Technology Technical Committee
Materyal Türü: Kitap
Dil:English
Baskı/Yayın Bilgisi: Los Alamitos, Calif. IEEE Computer Society Press c1992.
Konular:
IDDQ testing.
Metal oxide semiconductors, Complementary > Testing > Data processing.