Bridging faults and IDDQ testing

Bridging faults and IDDQ testing

Podrobná bibliografie
Korporativní autor: IEEE Computer Society. Test Technology Technical Committee
Médium: Kniha
Jazyk:English
Vydáno: Los Alamitos, Calif. IEEE Computer Society Press c1992.
Témata:
IDDQ testing.
Metal oxide semiconductors, Complementary > Testing > Data processing.