Bridging faults and IDDQ testing

Bridging faults and IDDQ testing

ग्रंथसूची विवरण
निगमित लेखक: IEEE Computer Society. Test Technology Technical Committee
स्वरूप: पुस्तक
भाषा:English
प्रकाशित: Los Alamitos, Calif. IEEE Computer Society Press c1992.
विषय:
IDDQ testing.
Metal oxide semiconductors, Complementary > Testing > Data processing.