Bridging faults and IDDQ testing

Bridging faults and IDDQ testing

Dades bibliogràfiques
Autor corporatiu: IEEE Computer Society. Test Technology Technical Committee
Format: Llibre
Idioma:English
Publicat: Los Alamitos, Calif. IEEE Computer Society Press c1992.
Matèries:
IDDQ testing.
Metal oxide semiconductors, Complementary > Testing > Data processing.