Bridging faults and IDDQ testing

Bridging faults and IDDQ testing

Bibliografiske detaljer
Institution som forfatter: IEEE Computer Society. Test Technology Technical Committee
Format: Bog
Sprog:English
Udgivet: Los Alamitos, Calif. IEEE Computer Society Press c1992.
Fag:
IDDQ testing.
Metal oxide semiconductors, Complementary > Testing > Data processing.