Bridging faults and IDDQ testing

Bridging faults and IDDQ testing

Sonraí bibleagrafaíochta
Údar corparáideach: IEEE Computer Society. Test Technology Technical Committee
Formáid: LEABHAR
Teanga:English
Foilsithe / Cruthaithe: Los Alamitos, Calif. IEEE Computer Society Press c1992.
Ábhair:
IDDQ testing.
Metal oxide semiconductors, Complementary > Testing > Data processing.