表紙画像

Evaluation of advanced semiconductor materials by electron microscopy

書誌詳細
共著者: NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy (1988 : Bristol, England), North Atlantic Treaty Organization. Scientific Affairs Division, Special Program on Condensed Systems of Low Dimensionality (NATO)
その他の著者: Cherns, David
フォーマット: 図書
言語:英語
出版事項: New York Plenum Press c1989.
主題:
Electron microscopy > Technique > Congresses.
Electrons > Diffraction > Congresses.
Semiconductors > Surfaces > Congresses.