Evaluation of advanced semiconductor materials by electron microscopy

Evaluation of advanced semiconductor materials by electron microscopy

Sonraí bibleagrafaíochta
Údair chorparáideacha: NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy (1988 : Bristol, England), North Atlantic Treaty Organization. Scientific Affairs Division, Special Program on Condensed Systems of Low Dimensionality (NATO)
Rannpháirtithe: Cherns, David
Formáid: LEABHAR
Teanga:English
Foilsithe / Cruthaithe: New York Plenum Press c1989.
Ábhair:
Electron microscopy > Technique > Congresses.
Electrons > Diffraction > Congresses.
Semiconductors > Surfaces > Congresses.