VLSI testing digital and mixed analogue/digital techniques

Xehetasun bibliografikoak
Egile nagusia:	Hurst, Stanley L.
Formatua:	Liburua
Hizkuntza:	English
Argitaratua:	Herts, U.K. The Institution of Electrical Engineers c1998.
Gaiak:	Integrated circuits > Very large scale integration > Testing.
Sarrera elektronikoa:	Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access